2008 ITWG Contacts

Home |Contact Us

2008 ITRS Update Contacts -- this list is not inclusive, but rather KEY contacts for 2008 updates. Please send revisions to Linda Wilson.
IRC/ORTC	Alan Allan	alan.k.allan@intel.com
IRC/staff	Linda Wilson	linda.wilson@sematech.org
IRC/staff	Yumiko Takamori	yumiko.takamori@intel.com
System Drivers and Design	Andrew Kahng	abk@cs.ucsd.edu
System Drivers and Design	Juan-antonio Carballo	jantonio@ieee.org
Test & Test Equipment	Roger Barth	roger.barth@numonyx.com
Test & Test Equipment	Mike Rodgers	mjrodge2@sbcglobal.net
Process Integration, Devices & Structures	Kwok Ng	ng@src.org
Process Integration, Devices & Structures	Thomas Skotnicki	thomas.skotnicki@st.com
Process Integration, Devices & Structures	Rich Liu	RichLiu@mxic.com.tw
Process Integration, Devices & Structures	Hidekazu Oda	oda.hidekazu@renesas.com
Process Integration, Devices & Structures	Victor Zhirnov	zhirnov@src.org
RF & A/MS Technologies for Wireless Communications	Margaret Huang	margaret.huang@freescale.com
RF & A/MS Technologies for Wireless Communications	Jack Pekarik	pekarik@us.ibm.com
RF & A/MS Technologies for Wireless Communications	Herb Bennett	herbert.bennett@nist.gov
Emerging Research Devices	Jim Hutchby	hutchby@src.org
Emerging Research Devices	OPEN
Emerging Research Materials	Dan Herr	herr@src.org
Emerging Research Materials	Mike Garner	mike.c.garner@intel.com
Front End Processes	Jeff Butterbaugh	jeff.butterbaugh@fsi-intl.com
Front End Processes	Larry Larson	larry.larson@SEMATECH.org
Front End Processes	Raj Jammy	raj.jammy@sematech.org
Lithography	Mike Lercel	michael.lercel@sematech.org
Lithography	OPEN
Interconnect	Chris Case	chris.case@boc.com
Interconnect	Harold Hosack	hosack@src.org
Factory Integration	Thomas Jefferson	thomas.jefferson@intel.com
Factory Integration	OPEN
Assembly & Packaging	Bill Bottoms	wbottoms@nanonexus.com
Assembly & Packaging	Bill Chen	william.chen@aseus.com
Assembly & Packaging	Chi Shih Chang	smsmicro@gmail.com
Environment, Safety & Health	Jim Jewett	jim.jewett@intel.com
Environment, Safety & Health	Michael Mocella	michael.mocella@USA.dupont.com
Yield Enhancement	Lothar Pfitzner	lothar.pfitzner@iisb.fraunhofer.de
Yield Enhancement	Dilip Patel	dilip.patel@ismi.sematech.org
Yield Enhancement	Andreas Nutsch	lothar.pfitzner@iisb.fraunhofer.de
Metrology	Alain Diebold	adiebold@uamail.albany.edu
Metrology	Steve Knight	stephen.knight@nist.gov
Metrology	Yaw Obeng	yaw.obeng@nist.gov
Modeling & Simulation	Jurgen Lorenz	juergen.lorenz@iisb.fraunhofer.de
Modeling & Simulation	Walt Trybula	w.trybula@tryb.org

The ITRS is devised and intended for technology assessment only and is without regard
to any commercial considerations pertaining to individual products or equipment.